Hydrogen induced resistance and optical transmittance of pulsed laser deposited Pd/Mg thin films
The hydrogen detection is an important issue for the societal acceptance of H2 as energy carrier. In present research work, we have investigated hydrogen sensing and optical properties of Pd/Mg thin films on glass substrate deposited by pulsed laser (PL). As-deposited thin films have been exposed (hydrogenation) to H2 gas (2 bar) at room temperature in a hydrogenation unit. Hydrogenated and dehydrogenated (at different temperatures) samples have been characterized using X-ray diffractometer (XRD), field-emission scanning electron microscopy (FE-SEM), UV-Vis-NIR spectrophotometer, atomic force microscopy (AFM). XRD results confirm the formation of hydride (MgH2) tetragonal phase upon hydrogenation of Pd/Mg films. Hydrogen induced resistance response of Pd/Mg films has been measured in-situ during hydrogenation/dehydrogenation process by using two- probe electrical method. The response time (sensitivity) of Pd/Mg films for hydrogen gas is ~ 60 s at room temperature. The study of optical transmittance of hydrogenated Pd/Mg films indicates their switchable mirror behavior.
Palladium; MgH2 thin film; Hydrogen sensor; Pulsed laser deposition; Electrical measurement
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