Indian Journal of Engineering and Materials Sciences (IJEMS)

Toutam, Vijay Kumar, Advanced Carbon Products and Metrology Section, Advanced Materials and Devices Metrology Division, CSIR-National Physical Laboratory, New Delhi 110 060, India, India

• Vol 27, No 6 (2020): IJEMS- DECEMBER 2020 - Articles
  Graphene layer number characterization using scanning kelvin probe force microscopy
  Abstract  PDF