Improved surface properties of PTFE polymer films using broad ion source
The main objective of this paper is to improve the surface properties of the polytetrafluoroethylene (PTFE) polymer films by ion beam irradiation with 2 keV Ar+ energy and various ion fluence ranging from 1×1017 to 3×1017 ions/cm2. Various characterization techniques, namely, X-ray diffraction (XRD), UV-Vis spectroscopy and electrical measurements have been used to confirm these changes. XRD measurement shows the decrease of the XRD peak intensity and reflects some loss of crystallinity after irradiation. The UV-Vis has shown a shift of the absorption edge of irradiated samples towards the visible region. The band gap energy Eg was calculated using Tauc’s relation, and its value decreases with an increase of ion fluence for all irradiated samples. Increasing ion fluence leads to slight increase in electrical conductivities (σdc and σac) and dielectric loss ε2 for PTFE samples.
PTFE; Ion Beam; SRIM; Structural; optical; Electrical properties
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