Philip, Anu, Cochin university of Science & Technology, India
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Vol 53, No 7 (2015): Indian Journal of Pure & Applied Physics - Condensed Matter: Electronic Structure, Electrical, Magnetic and Optical Properties
Effect of frequency and bias voltage on the electrical and dielectric properties of atomic layer deposited Al/Al2O3/ p-Si MOS structure at room temperature
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Indian Journal of Pure & Applied Physics (IJPAP)