Ojha, V N, Time and Frequency and Electrical and Electronics Metrology, CSIR-National Physical Laboratory, New Delhi 110 012, India, India
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Vol 56, No 12 (2018): Indian Journal of Pure & Applied Physics - Interdisciplinary Physics and Related Areas of Science and Technology
A simple method to estimate the loading effects of Al/Si on the characteristic impedance of multilayer microstrip line
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Indian Journal of Pure & Applied Physics (IJPAP)