Hyper Parameter Optimization for Transfer Learning of ShuffleNetV2 with Edge Computing for Casting Defect Detection

Prasad, L V Narasimha; Dokku, Durga Bhavani; Talasila, Sri Lakshmi; Tumuluru, Praveen


A casting defect is an expendable abnormality and the most undesirable thing in the metal casting process. In Casting Defect Detection, deep learning based on Convolution Neural Network (CNN) models has been widely used, but most of these models require a lot of processing power. This work proposes a low-power ShuffleNet V2-based Transfer Learning model for defect identification with low latency, easy upgrading, increased efficiency, and an automatic visual inspection system with edge computing. Initially, various image transformation techniques were used for data augmentation on casting datasets to test the model flexibility in diverse casting. Subsequently, a pre-trained lightweight ShuffleNetV2 model is adapted, and hyperparameters are fine-tuned to optimize the model. The work results in a lightweight, adaptive, and scalable model ideal for resource-constrained edge devices. Finally, the trained model can be used as an edge device on the NVIDIA Jetson Nano-kit to speed up detection. The measures of precision, recall, accuracy, and F1 score were utilized for model evaluation. According to the statistical measures, the model accuracy is 99.58%, precision is 100%, recall is 99%, and the F1-Score is 100 %.


Edge Computing, Industrial Internet of Things, NVIDIA Jetson Nano-kit, ShuffleNetV2

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