Synthesis and structural characterization of magnetic semiconductor silver iron germanium selenide (Ag2FeGeSe4)
Abstract
The quaternary semiconductor compound Ag2FeGeSe4, belonging to the system I2-II-IV-VI4 and synthesized by the meltand anneal technique, was structurally characterized by Rietveld refinement of the powder X-ray diffraction data. Thiscompound crystallizes in the orthorhombic space group Pmn21, Z = 4, with unit cell parameters a = 7.6478(1) Å, b =6.5071(1) Å, c = 6.4260(1) Å, and V = 319.79(1) Å3, in a wurtzite-stannite arrangement with a Cu2CdGeS4-type structure.The Debye temperature (D) estimated for this compound was 194 K.
Keyword(s)
Semiconductors, Powder X-ray diffraction, Crystal structure, Rietveld refinement
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